
Filament, high temperature, EI ion source. Used on the 5973, 5975, and 5977 MSD for the Electron Impact (EI). Not used with the HES.
- Unit of Measure:
- EA
Filament, high temperature, EI ion source. Used on the 5973, 5975, and 5977 MSD for the Electron Impact (EI). Not used with the HES.